National Instruments Corporation 790137-01

SPARE KIT,ADC ERS IV,HEINZINGER 0563568400

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National Instruments Corporation 787883-01

VCSEL I-V TEST SUBSYSTEM REPLACEMENT ACCESSORIES

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National Instruments Corporation 789861-01

PXIE-1490, 4 INPUT, FPD-LINK IV 10G

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National Instruments Corporation 868170-02B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 6 CH...

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National Instruments Corporation 868170-03C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 868205-01

BUNDLE, ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 4 CH...

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National Instruments Corporation 789775-01

RH-5460 2 CHANNEL REMOTE HEAD ULTRA-FAST PARAMETRIC I-V MEASUREMENT DEVICE

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National Instruments Corporation 910903-71

INTEGRATING THE VCSEL I-V TEST SUBSYSTEM COURSE, ON-DEMAND, 1-YEAR ACCESS

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National Instruments Corporation 868170-01B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

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National Instruments Corporation 868170-01CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

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National Instruments Corporation 868170-02CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 6 CH CONFIG,...

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National Instruments Corporation 868170-03B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 868170-01C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/18 SLOT...

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National Instruments Corporation 868170-02C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 6 CH...

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National Instruments Corporation 868170-03CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH CONFIG,...

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National Instruments Corporation 868170-04B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-04C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-05C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 20 CH...

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National Instruments Corporation 868170-06B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/ 9SLOT...

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National Instruments Corporation 868170-05B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 20 CH...

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National Instruments Corporation 868170-04CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH CONFIG,...

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National Instruments Corporation 868170-05CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 20 CH CONFIG,...

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National Instruments Corporation 868170-06CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/ 9SLOT...

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National Instruments Corporation 868170-06C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 2 CH/ 9SLOT...

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National Instruments Corporation 868170-08C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 4 CH CONFIG,...

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National Instruments Corporation 868170-08CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 4 CH CONFIG,...

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National Instruments Corporation 868170-08B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 4 CH CONFIG,...

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National Instruments Corporation 790627-01

IVN-1417, 4 INPUT, FPD-LINK IV, DS90UB988 DESERIALIZER

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National Instruments Corporation 788914-01

2 CHANNEL VCSEL I-V TEST INSTRUMENT, 15 V 10 A

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National Instruments Corporation 788352-01

PXIE-1488, 8 OUTPUT, FPD-LINK IV, DS90UB971 SERIALIZER

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National Instruments Corporation 788350-01

PXIE-1488, 8 INPUT, FPD-LINK IV, DS90UB9702 DESERIALIZER

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National Instruments Corporation 788351-01

PXIE-1488, 4 INPUT /4 OUTPUT, FPD-LINK IV, DS90UB971/DS90UB9702 SERDES

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